Twinning in Permalloy Films as Observed by Electron Diffraction and Electron Microscopy
作者:
F. R. L. Schoening,
A. Baltz,
期刊:
Journal of Applied Physics
(AIP Available online 1962)
卷期:
Volume 33,
issue 4
页码: 1442-1445
ISSN:0021-8979
年代: 1962
DOI:10.1063/1.1728751
出版商: AIP
数据来源: AIP
摘要:
Permalloy films (83 wt.% Ni‐17 wt.% Fe) epitaxially grown on NaCl, were annealed by electron bombardment in an electron microscope. Perfect single‐crystal diffraction patterns indicated the presence of the [100] parent crystal and [122] twin crystals. Fringe patterns observed on electron micrographs were identified by dark field microscopy and electron diffraction as being caused by platelets of twins, 100–400 A thick, lying parallel to {111} planes of the parent crystal. The nonintegral reflections, commonly observed in conjunction with twin reflections, were shown to be caused by double diffraction.
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