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A fast spectroscopic diagnostic for the measurement of plasma impurity ion dynamics

 

作者: D. J. Den Hartog,   R. J. Fonck,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1994)
卷期: Volume 65, issue 10  

页码: 3238-3242

 

ISSN:0034-6748

 

年代: 1994

 

DOI:10.1063/1.1144557

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A high‐resolution spectrometer has been developed and used to measure simultaneously impurity ion temperatures and flow velocities in high temperature plasmas with 10 &mgr;s temporal resolution (limited by digitization rate). This device is actually a duo‐spectrometer: measurements from two different chordal views of the plasma can be made simultaneously via two separate quartz input fiber optic bundles coupled to the entrance slits which are tilted to compensate for line curvature. The dispersed spectra on the exit plane of the duo‐spectrometer are coupled via quartz fiber optics to two arrays of 16 photomultiplier tubes each. Measurements made by recording the Doppler broadened and shifted 227.091 nm emission from the C vimpurity ions in the Madison Symmetric Torus (MST) reversed‐field pinch (RFP) plasma have achieved precisions of <6 eV for temperatures of 150 eV and <0.7 km/s for flow velocities of 6 km/s. Representative results from the MST RFP indicate that the toroidal flow velocity drops and ion temperature increase during sawtooth events in MST.

 

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