Structural analysis of Au–Ni–Ge and Au–Ag–Ge alloyed ohmic contacts on modulation‐doped AlGaAs–GaAs heterostructures
作者:
T. K. Higman,
M. A. Emanuel,
J. J. Coleman,
S. J. Jeng,
C. M. Wayman,
期刊:
Journal of Applied Physics
(AIP Available online 1986)
卷期:
Volume 60,
issue 2
页码: 677-680
ISSN:0021-8979
年代: 1986
DOI:10.1063/1.337413
出版商: AIP
数据来源: AIP
摘要:
Both secondary ion mass spectrometry and transmission electron microscopy have been used to characterize Au–Ni–Ge and Au–Ag–Ge ohmic contacts to modulation‐doped GaAs/AlGaAs heterostructures. The time periods for alloying the contact were kept to a minimum (<25 s) in order to obtain controlled diffusion of Ge into the semiconductor. Structural analysis shows that a stable alloy contact is formed after 3 s of alloying at temperatures above the Au–Ge melting point. There were no major structural or compositional changes observed with longer alloying times. The Ge‐rich region has a tendency to regrow epitaxially on the GaAs after alloying, as shown by high‐resolution electron microscopy.
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