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FIELD EMISSION SHADOW MICROSCOPY

 

作者: Allan J. Melmed,  

 

期刊: Applied Physics Letters  （AIP Available online 1968）
卷期: Volume 12, issue 3  

页码: 100-102

 

ISSN:0003-6951

 

年代: 1968

 

DOI:10.1063/1.1651891

 

出版商: AIP

 

数据来源: AIP

 

摘要:

An electron field emitter is used as an approximate point source of electrons to produce magnified shadows, or profile images, of small electrically conducting objects in ultrahigh vacuum. Some electrical and electron optical properties of this type of microscopy are described.

 

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