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Temperature measurements of thin films on substrates

 

作者: D.de Cogan,   A.F.Howe,   P.W.Webb,  

 

期刊: IEE Proceedings I (Solid-State and Electron Devices)  （IET Available online 1985）
卷期: Volume 132, issue 3  

页码: 143-146

 

年代: 1985

 

DOI:10.1049/ip-i-1.1985.0029

 

出版商: IEE

 

数据来源: IET

 

摘要:

Thin-film fuses consisting of single layers of silver have been deposited on silica and alumina substrates. Results of temperature measurements are presented for the case where the fuse current is significantly below the level necessary for metal vaporisation and arc formation.

 

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