Evidence for Partly Specular Reflection of Electrons in Thin Metal Films Condensed on Amorphous Substrates
作者:
I. Estermann,
T. Schlesinger,
期刊:
Journal of Applied Physics
(AIP Available online 1970)
卷期:
Volume 41,
issue 7
页码: 2802-2805
ISSN:0021-8979
年代: 1970
DOI:10.1063/1.1659318
出版商: AIP
数据来源: AIP
摘要:
Measurements of the electrical resistivity of thin silver films prepared by evaporation on amorphous substrates in ultrahigh vacuum indicate partial specular reflection of the conduction electrons at the films' surfaces. Some correlation between the electrical resistivity and the structure of the deposited films was observed, and the influence of residual gases during the evaporation process on structure and properties of the films was investigated.
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