Prediction of IEM Model for Backscattering Enhancement
作者:
Chin-Yuan Hsieh,
期刊:
Electromagnetics
(Taylor Available online 2000)
卷期:
Volume 20,
issue 3
页码: 205-231
ISSN:0272-6343
年代: 2000
DOI:10.1080/027263400308258
出版商: Informa UK Ltd
关键词: Backspattering Enhancement Multiple Scattering
数据来源: Taylor
摘要:
Predictions for scattering from randomly very rough surfaces are developed and compared with experimental data. The integral equation method with multiple scattering is developed to predict this backscattering enhancement phenomenon. The backscattering enhancement can be predicted from the constructive interference of multiple surfaces scattering from a very roughly random surface. For specialized surfaces involving roughness large compared with the incident wavelength, the backscattering enhancement takes place. In this paper we show that the phenomenon of backscattering enhancement becomes evident for both the normalized surface height > 1.5 and the surface root mean square slope > 0.5. Further, we also show that the incident angle is a factor for the backscattering enhancement. The derivation of the basic surface scattering model is provided and a computer simulation is also provided to compare with measurement. The phenomenon of backscattering enhancement is observed in both the integral equation model (IEM) model prediction and experimental data. In comparing the IEM model with measured data over a wide range of frequency and angle, excellent agreement is found. The difference between the model prediction and data is less than a dB.
点击下载:
PDF (365KB)
返 回