Direct evidence is presented that ⟨100⟩ dielectric breakdown dendrites on LiF cleavage surfaces are grooved features that are flanked by volume ⟨110⟩ channels. The dendrite has presumably resulted from disruptive forces attending an electronic breakdown process. No evidence of primary involvement of dislocations in the process of dielectric breakdown was found. Indirect evidence is presented thatYbranches and the etch features surrounding random sites represent the surface intersections of ⟨110⟩ spikes that are associated with submerged electrical breakdown paths. The existence of the ⟨110⟩ dielectric breakdown dendrite and its relationship to theYbranch is noted.