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A Semiautomatic Integrating Densitometer with Digital Readout for One Dimensional X‐Ray Diffraction Films

 

作者: W. E. Keefe,   R. C. Williams,   W. T. Ham,   J. M. Stewart,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1970）
卷期: Volume 41, issue 12  

页码: 1712-1714

 

ISSN:0034-6748

 

年代: 1970

 

DOI:10.1063/1.1684394

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A technique is described whereby the density of diffraction spots on unidimensional x‐ray film is measured by means of a microdensitometer and recorded on a strip chart recorder; simultaneously, the area under the curve is integrated electronically and the results are displayed on a digital counting device. The data for one structure which has been completed gave a finalRvalue of 0.064.

 

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