Semi‐automatic atomic force microscope for imaging in solution
作者:
Jianxun Mou,
Gang Huang,
Zhifeng Shao,
期刊:
Review of Scientific Instruments
(AIP Available online 1995)
卷期:
Volume 66,
issue 12
页码: 5527-5531
ISSN:0034-6748
年代: 1995
DOI:10.1063/1.1146079
出版商: AIP
数据来源: AIP
摘要:
A semiautomatic atomic force microscope for imaging in solution is described. With this new design, the laser beam is focused into a fine line, and a rotating mirror is used to deflect the optical signal onto a fixed photodetector. The alignment is now operated with stepper motors. Combined with a three stepper motor sequential advancement for tip engagement, the operation of the atomic force microscope for imaging in solution is much simplified, and the crashing of the tip is largely avoided. Since all controls are now coupled with stepper motors, this system is fully compatible with automation and operation in a self sealed temperature controlled chamber. The design and the construction of this system is relatively simple and can be fitted into any existing system. ©1995 American Institute of Physics.
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