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Study of tip magnetization behavior in magnetic force microscope

 

作者: K. Sueoka,   K. Okuda,   N. Matsubara,   F. Sai,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1991)
卷期: Volume 9, issue 2  

页码: 1313-1317

 

ISSN:1071-1023

 

年代: 1991

 

DOI:10.1116/1.585186

 

出版商: American Vacuum Society

 

关键词: ATOMIC FORCE MICROSCOPY;USES;IRON;THIN FILMS;MAGNETIZATION;MAGNETIC MOMENTS;MAGNETIC FORCE MICROSCOPE;MAGNETIC RECORDING HEAD

 

数据来源: AIP

 

摘要:

The behavior of the magnetic moment at the tip end of the magnetic force microscope (MFM) was investigated by using two types of tip: iron wire and iron coated. MFM images of a magnetic head obtained by these two tips show quite different features. These differences were explained by assuming that the magnetic moment of the iron wire tip is almost fixed along the tip axis, while that of the iron coated tip follows the external field. In addition, it was found that the moment of the iron coated tip can respond to an ac excited head field of up to 50 MHz.

 

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