Study of tip magnetization behavior in magnetic force microscope
作者:
K. Sueoka,
K. Okuda,
N. Matsubara,
F. Sai,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1991)
卷期:
Volume 9,
issue 2
页码: 1313-1317
ISSN:1071-1023
年代: 1991
DOI:10.1116/1.585186
出版商: American Vacuum Society
关键词: ATOMIC FORCE MICROSCOPY;USES;IRON;THIN FILMS;MAGNETIZATION;MAGNETIC MOMENTS;MAGNETIC FORCE MICROSCOPE;MAGNETIC RECORDING HEAD
数据来源: AIP
摘要:
The behavior of the magnetic moment at the tip end of the magnetic force microscope (MFM) was investigated by using two types of tip: iron wire and iron coated. MFM images of a magnetic head obtained by these two tips show quite different features. These differences were explained by assuming that the magnetic moment of the iron wire tip is almost fixed along the tip axis, while that of the iron coated tip follows the external field. In addition, it was found that the moment of the iron coated tip can respond to an ac excited head field of up to 50 MHz.
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