Evolution of implanted carbon in silicon upon pulsed excimer laser annealing
作者:
Z. Ka´ntor,
E. Fogarassy,
A. Grob,
J. J. Grob,
D. Muller,
B. Pre´vot,
R. Stuck,
期刊:
Applied Physics Letters
(AIP Available online 1996)
卷期:
Volume 69,
issue 7
页码: 969-971
ISSN:0003-6951
年代: 1996
DOI:10.1063/1.117098
出版商: AIP
数据来源: AIP
摘要:
Formation of epitaxial Si1−yCysubstitutional alloy layers on monocrystalline silicon surfaces withy≊1 at. % is reported. The preparation method was carbon ion implantation, followed by KrF excimer laser annealing. Results of Rutherford backscattering (RBS), secondary ion mass spectrometry (SIMS) and infrared absorption analyses are compared. The authors concluded that, up to ∼1 at. % carbon content, the dominant process is nonequilibrium trapping of carbon in substitutional lattice sites upon fast resolidification. Above this concentration the complex carbon redistribution processes are influenced by silicon carbide precipitation in the melt and segregation effects in the near‐surface region. ©1996 American Institute of Physics.
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