Microscopic observations of Si(100) TEM film locally milled by a Ga+focused ion beam
作者:
Kazuo Furuya,
Nobuhiro Ishikawa,
期刊:
Radiation Effects and Defects in Solids
(Taylor Available online 1992)
卷期:
Volume 124,
issue 1
页码: 61-67
ISSN:1042-0150
年代: 1992
DOI:10.1080/10420159208219828
出版商: Taylor & Francis Group
关键词: Ga+FIB;Si(100) wafer;SEM and TEM observation;beam affected zone;the flakes of Ga-related film;metastable Ga phase
数据来源: Taylor
摘要:
Structural changes of Si(100) locally milled by a 8 keV Ga+focused ion beam were investigated with SEM and TEM. A Ga+beam was focused on a thin section of a TEM specimen and at room temperature made a hole of about 10 μm. The observations were carried out at the region adjacent to the hole. The results of SEM and TEM indicated that a beam affected zone was formed surrounding the hole, where Ga was detected by EDS. TEM photographs also showed flakes of Ga-related film with an orientation relationship with the Si(100) matrix spread in this regime. Analysis of the electron diffraction pattern and the phase relationship of the Si-Ga system indicated the possibility of these flakes being the metastable Ga phase which had interplanar spacing larger than 0.3 nm.
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