Thin film mechanically controllable break junctions
作者:
R. J. P. Keijsers,
O. I. Shklyarevskii,
J. G. H. Hermsen,
H. van Kempen,
期刊:
Review of Scientific Instruments
(AIP Available online 1996)
卷期:
Volume 67,
issue 8
页码: 2863-2866
ISSN:0034-6748
年代: 1996
DOI:10.1063/1.1147089
出版商: AIP
数据来源: AIP
摘要:
An adaptation of the mechanically controllable break junction technique using thin metallic films to create point contacts and tunnel junctions is presented. The junctions that are created using this very simple method are extremely stable, and can easily be adjusted from rather large point contacts (R≊0.1 &OHgr;) to high‐resistance (1010&OHgr;) tunnel junctions. The electrodes can be kept very clean by breaking the sample in ultrahigh vacuum or in a very pure helium atmosphere at 1–4 K. Point‐contact spectra of good quality were measured for contacts of 0.1–500 &OHgr;. For very small contacts, the expected steplike increase of junction resistance with decreasing contact size was observed, with a jump to tunneling behavior occurring at resistances of 12–14 k&OHgr;. ©1996 American Institute of Physics.
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