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MIL-STD-781 and Confidence Intervals

 

作者: SchmeeJosef,  

 

期刊: Journal of Quality Technology  （Taylor Available online 1980）
卷期: Volume 12, issue 2  

页码: 98-105

 

ISSN:0022-4065

 

年代: 1980

 

DOI:10.1080/00224065.1980.11980943

 

出版商: Taylor&Francis

 

关键词: Confidence Intervals;Exponential Distribution;Fixed-Length Tests;Sequential Tests

 

数据来源: Taylor

 

摘要:

Various examples illustrate how to obtain confidence limits on the mean time between failures (MTBF) of an exponential distribution from data obtained from one of the fixed-size or sequential test plans of MIL-STD-781C. For fixed-length tests, the methods by B. Epstein and the modifications of H. L. Harter are briefly discussed. For the sequential tests simple charts for newly developed methods of Bryant and Schmee are given.

 

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