In situtransmission electron microscopy study of plastic deformation in passivated Al–Cu thin films
作者:
D. Jawarani,
H. Kawasaki,
I.-S. Yeo,
L. Rabenberg,
J. P. Stark,
P. S. Ho,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 82,
issue 1
页码: 171-181
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.365584
出版商: AIP
数据来源: AIP
摘要:
Plastic deformation in passivated Al-1 wt &percent;Cu thin films was studiedin situusing a straining device in the transmission electron microscope. Both edge and screw dislocations were found to have caused slip on inclined {111} planes. Multiple slip was frequently observed as two or more sets of intersecting slip traces. Microstructural investigations of both unpassivated and passivated Al-1 wt &percent;Cu films indicate that grain size and encapsulation by passivating layers are major contributors to strength of a thin film with a particular thickness. Additional strengthening is also provided by interactions between dislocations on multiple slip systems. The roles of grain orientation and precipitates in plastic deformation are also discussed. ©1997 American Institute of Physics.
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