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Photoemission measurement for low energy x‐ray detector applications

 

作者: Robert H. Day,  

 

期刊: AIP Conference Proceedings  (AIP Available online 1981)
卷期: Volume 75, issue 1  

页码: 44-58

 

ISSN:0094-243X

 

年代: 1981

 

DOI:10.1063/1.33143

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Photoemission has been studied for nearly 100 years as both a means of investigating quantum physics, and as a practical technique for transducing optical/x‐ray photons into electrical currents. Numerous x‐ray detection schemes, such as streak cameras and x‐ray sensitive diodes, exploit this process because of its simplicity, adaptability, and speed. Recent emphases on diagnostics for low temperature, high density, and short‐lived, plasmas for inertial confinement fusion has stimulated interest in x‐ray photoemission in the sub‐kilovolt regime. In this paper, a review of x‐ray photoemission measurements in the 50 eV to 10 keV x‐ray region is given and the experimental techniques are reviewed. A semiempirical model of x‐ray photoemission is disussed and compared to experimental measurements. Finally, examples of absolutely calibrated instruments are shown.

 

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