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Semiautomatic Acquisition of Extreme Ultraviolet Reflectance Data for Calculating Optical Constants

 

作者: W. R. Hunter,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1970)
卷期: Volume 41, issue 10  

页码: 1419-1422

 

ISSN:0034-6748

 

年代: 1970

 

DOI:10.1063/1.1684297

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A data acquisition system is described that obtains reflected intensity measurements in digital form directly on punched cards. The cards can then be fed directly to a computer to calculate reflectances, thus eliminating the time consuming process of reducing strip chart recordings to reflectances. In addition, the precision with which the reflectances can be calculated is improved, which is important if they are to be used to calculate optical constants.

 

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