Theory of the metal-insulator-semiconductor thyristor
作者:
S.E.D.Habib,
J.G.Simmons,
期刊:
IEE Proceedings I (Solid-State and Electron Devices)
(IET Available online 1980)
卷期:
Volume 127,
issue 4
页码: 176-182
年代: 1980
DOI:10.1049/ip-i-1.1980.0037
出版商: IEE
数据来源: IET
摘要:
The bistable behaviour displayed by the m.i.-n-p+switch (designated m.i.s.s.: an acronym for metal-insulator-silicon switch) can be electrically controlled via a third gate terminal. This three-terminal device is named m.i.s.t. for metal-insulator-semiconductor thyristor. The function of the gate control is to strengthen, or weaken, the intrinsic regeneration within the m.i.s.s., by means of majority-carrier injection, minority-carrier injection, or electrostatic control of the n-p+junction voltage. The previously reported feedback model of the m.i.s.s. device is extended to cover the three-terminal m.i.s.t. Simple closed-form expressions for the gate-control efficiency are derived for the two modes of operation of the m.i.s.t. It is shown that the gate-control efficiency is largest for the avalanche-mode m.i.s.s. with a majority-carrier injecting gate.
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