Tip artifacts in atomic force microscope imaging of ion bombarded nanostructures on germanium surfaces
作者:
Y. J. Chen,
I. H. Wilson,
C. S. Lee,
J. B. Xu,
M. L. Yu,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 82,
issue 11
页码: 5859-5861
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.366454
出版商: AIP
数据来源: AIP
摘要:
In this communication, we present a study of tip artifacts in atomic force microscope images of nanometer-scale cellular structures created on germanium surfaces by ion bombardment. It is demonstrated that the appearance of a columnar/granular morphology is due to severe image distortion when the tip size is comparable with the mean cell/hole diameter. These tip artifacts can often be deconvoluted by inverting the image and the lateral extension of the cell/hole can be reproduced with reasonable accuracy. ©1997 American Institute of Physics.
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