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An investigation of the properties of cubic GaN grown on GaAs by plasma‐assisted molecular‐beam epitaxy

 

作者: S. Strite,   J. Ruan,   Z. Li,   A. Salvador,   H. Chen,   David J. Smith,   W. J. Choyke,   H. Morkoç,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1991)
卷期: Volume 9, issue 4  

页码: 1924-1929

 

ISSN:1071-1023

 

年代: 1991

 

DOI:10.1116/1.585381

 

出版商: American Vacuum Society

 

关键词: GALLIUM NITRIDES;LAYERS;GALLIUM ARSENIDES;FILMS;MOLECULAR BEAM EPITAXY;OPTICAL PROPERTIES;CRYSTAL STRUCTURE;X−RAY DIFFRACTION;TRANSMISSION ELECTRON MICROSCOPY;CATHODOLUMINESCENCE;ENERGY GAP;MEDIUM TEMPERATURE;GaN

 

数据来源: AIP

 

摘要:

We present the first comprehensive investigation of the bulk properties, both optical and structural, of cubic GaN as grown by plasma‐assisted molecular‐beam epitaxy on vicinal (100) GaAs substrates. X‐ray measurements determined the crystal structure of GaN/GaAs to be cubic with a lattice constant of 4.5 Å. High resolution transmission electron microscopy revealed a high density of planar defects propagating along the GaN {111} planes. The majority of the defects originated from disordered regions at the GaN/GaAs interface. The optical properties of the films were investigated by cathodoluminescence which revealed a broad midgap peak as well as several sharp emission peaks just below the expected band gap. The data imply that the room temperature band gap of cubic GaN is approximately 3.45 eV.

 

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