Pulsed laser‐induced desorption and optical imaging on a nanometer scale with scanning near‐field microscopy using chemically etched fiber tips
作者:
Dieter Zeisel,
Stefan Nettesheim,
Bertrand Dutoit,
Renato Zenobi,
期刊:
Applied Physics Letters
(AIP Available online 1996)
卷期:
Volume 68,
issue 18
页码: 2491-2492
ISSN:0003-6951
年代: 1996
DOI:10.1063/1.115831
出版商: AIP
数据来源: AIP
摘要:
Laser‐induced desorption on a nanometer scale using scanning near‐field optical microscopy (SNOM) is demonstrated. Pulsed laser‐induced desorption of anthracene with completely metallized SNOM fiber tips resulted in a lateral resolution of 70 nm. This became possible due to the use of chemically etched tips with a taper region smaller than 200 &mgr;m and cone angles varying from 6 to 30 degrees. These tips are further useful for optical imaging with a very high optical transmission coefficient (up to 10−3), achieving a lateral resolution of 80 nm. ©1996 American Institute of Physics.
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