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Pulsed laser‐induced desorption and optical imaging on a nanometer scale with scanning near‐field microscopy using chemically etched fiber tips

 

作者: Dieter Zeisel,   Stefan Nettesheim,   Bertrand Dutoit,   Renato Zenobi,  

 

期刊: Applied Physics Letters  (AIP Available online 1996)
卷期: Volume 68, issue 18  

页码: 2491-2492

 

ISSN:0003-6951

 

年代: 1996

 

DOI:10.1063/1.115831

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Laser‐induced desorption on a nanometer scale using scanning near‐field optical microscopy (SNOM) is demonstrated. Pulsed laser‐induced desorption of anthracene with completely metallized SNOM fiber tips resulted in a lateral resolution of 70 nm. This became possible due to the use of chemically etched tips with a taper region smaller than 200 &mgr;m and cone angles varying from 6 to 30 degrees. These tips are further useful for optical imaging with a very high optical transmission coefficient (up to 10−3), achieving a lateral resolution of 80 nm. ©1996 American Institute of Physics.

 

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