Advances in instrumentation have made it possible in recent years to study the microstructure of inorganic materials at atomic resolution using the technique of high-resolution electron microscopy (HREM). Details of instrumentation have been described elsewhere [l], and applications and trends for HREM have recently been reviewed [2]. Although HREM is primarily a technique for studying bulk defects, it is increasingly also being applied in the profile-imaging mode to derive information about surfaces [3]. The high spatial resolution of the electron microscope makes it a valuable tool for the characterization of heterogeneous catalysts. This is evidenced by the growing number of studies wherein electron micrographs are being used to describe the morphology of a particular catalyst. Profile imaging is proving particularly useful in this regard for following changes in surface structure as a function of treatment conditions [4].