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Structure-property relations in polycrystalline titanate thin films

 

作者: M. Klee,   A. de Veirman,   D.J. Taylor,   P.K. Larsen,  

 

期刊: Integrated Ferroelectrics  （Taylor Available online 1994）
卷期: Volume 4, issue 3  

页码: 197-206

 

ISSN:1058-4587

 

年代: 1994

 

DOI:10.1080/10584589408017022

 

出版商: Taylor & Francis Group

 

关键词: titanate thin films;sol-gel processing;TEM studies;x-ray fluorescence analysis;fatigue;retention

 

数据来源: Taylor

 

摘要:

Ferroelectric Pb(Zr,Ti)O3films have been deposited by spin-coating techniques, applying a modified sol-gel process. The growth of the thin films as a function of processing has been investigated by structural analyses using XRD, XRF, SEM and TEM methods. The data are the basis for the discussion of the ferroelectric properties of the layers.

 

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