Rapid measurement of static and dynamic surface forces
作者:
William A. Ducker,
Robert F. Cook,
期刊:
Applied Physics Letters
(AIP Available online 1990)
卷期:
Volume 56,
issue 24
页码: 2408-2410
ISSN:0003-6951
年代: 1990
DOI:10.1063/1.102893
出版商: AIP
数据来源: AIP
摘要:
We present a technique for rapid measurement of surface forces using an ac force microscope. Measurement of both the amplitude and relative phase of a cantilever probe allows simultaneous and rapid determination of static and velocity‐dependent forces of order nN over nm length scales. Using this technique, we have also demonstrated the high lateral spatial resolution of the force microscope in the measurement of surface forces.
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