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Solution to the bistability problem in shear force distance regulation encountered in scanning force and near-field optical microscopes

 

作者: A. V. Zvyagin,   J. D. White,   M. Kourogi,   M. Kozuma,   M. Ohtsu,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 71, issue 17  

页码: 2541-2543

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.120111

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The bistability problem, common to scanning microscopes employing lateral dithering of the probe for image formation (i.e., shear force microscope) or probe-sample distance control (i.e., near-field optical microscope) is shown to stem from the two nearly degenerate vibration degrees of freedom possessed by a laterally dithered fiber. Controlling the fiber vibration direction by means of a four-sectioned piezo was found to be a simple and effective solution of the problem. An image of a microtubule is presented to demonstrate the improved imaging ability. ©1997 American Institute of Physics.

 

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