Solution to the bistability problem in shear force distance regulation encountered in scanning force and near-field optical microscopes
作者:
A. V. Zvyagin,
J. D. White,
M. Kourogi,
M. Kozuma,
M. Ohtsu,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 17
页码: 2541-2543
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.120111
出版商: AIP
数据来源: AIP
摘要:
The bistability problem, common to scanning microscopes employing lateral dithering of the probe for image formation (i.e., shear force microscope) or probe-sample distance control (i.e., near-field optical microscope) is shown to stem from the two nearly degenerate vibration degrees of freedom possessed by a laterally dithered fiber. Controlling the fiber vibration direction by means of a four-sectioned piezo was found to be a simple and effective solution of the problem. An image of a microtubule is presented to demonstrate the improved imaging ability. ©1997 American Institute of Physics.
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