Chemical kinetics and equilibrium analysis of I-III-VI films
作者:
Robert Birkmire,
Michael Engelmann,
期刊:
AIP Conference Proceedings
(AIP Available online 1999)
卷期:
Volume 462,
issue 1
页码: 23-28
ISSN:0094-243X
年代: 1999
DOI:10.1063/1.57950
出版商: AIP
数据来源: AIP
摘要:
Preliminary results are presented on the growth and characterization of Cu-In-Se-S thin films formed by reaction of Cu-In layers with aH2Se/H2Sgas mixture. The approach was to first develop a process to grow device qualityCuInS2films by reaction of a Cu-In layer inH2S.This process was then modified to form alloyedCuIn(Se,&hthinsp;S)2films. A quantitative model for the reaction of Cu-In films in a CVD reactor with a mixedH2S-H2Seflowing gas was developed and verified. The composition of theCuIn(Se,&hthinsp;S)2film can be controlled by the concentrationH2Se+H2Sand/orSe2+S2in the gas phase. Graded films can be made by annealing eitherCuInSe2orCuInS2films in a controlled Se and/or S containing atmosphere. Expanding this to include Ga in the films will provide a basis for engineering film compositions and bandgaps. ©1999 American Institute of Physics.
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