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Correction of X‐Ray Diffraction Profiles for Instrumental Broadening in Transmission Geometry

 

作者: Sabri Ergun,  

 

期刊: Journal of Applied Physics  (AIP Available online 1969)
卷期: Volume 40, issue 1  

页码: 293-296

 

ISSN:0021-8979

 

年代: 1969

 

DOI:10.1063/1.1657046

 

出版商: AIP

 

数据来源: AIP

 

摘要:

When polychromatic radiation is used in x‐ray diffraction, the instrumental broadening changes with the scattering angle. It is shown that when transmission geometry is used, the instrumental broadening can be expressed in terms of the profile of the primary beam and its wavelength distribution. Consequently, it becomes possible to correct the entire intensity profile for instrumental broadening. The correction is made by successive foldings of the observed profile, and is demonstrated using the intensity profiles of raw and heat‐treated carbon black.

 

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