GHZ polarization dynamics in ferroelectric thin films
作者:
Charles Hubert,
Jeremy Levy,
Ed Cukauskas,
StephenW. Kirchoefer,
期刊:
Integrated Ferroelectrics
(Taylor Available online 2000)
卷期:
Volume 28,
issue 1-4
页码: 227-236
ISSN:1058-4587
年代: 2000
DOI:10.1080/10584580008222234
出版商: Taylor & Francis Group
关键词: Ferroelectric thin films;time-resolved;confocal microscopy;BaSrTiO3;microwave;dielectric loss
数据来源: Taylor
摘要:
We present results from experiments which measure the local dielectric response of ferroelectric thin films driven by microwave-frequency electric fields. The repetition rate of a mode-locked Ti:Sapphire laser is used to generate a microwave drive signal that is phase-locked to an optical probe pulse and applied to the ferroelectric thin film. The induced polarization change in the ferroelectric film is measured stroboscopicallyviathe electro-optic effect. Polarization images are acquired by scanning the laser beam across the sample in a confocal geometry. Time resolution is achieved by changing the delay between the electrical pump and the optical probe. Initial results show large local phase shifts in the ferroelectric response of closely separated regions of a Ba0.5Sr0.5TiO3thin film. This new experimental technique may help to understand the physical mechanisms of dielectric loss in these materials.
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