This work shows that the electric field enhancement of the plate edges in all-film capacitors has only a very small effect on the current value through the capacitor although this enhancement could lead to dielectric breakdown at low frequency for high voltage. On the other hand, the electric field along the plates depends on frequency and on the resistivity of the plates. Consequently, the surface admittanceYsof the capacitor will also vary with frequency. This latter parameter has been described by an equivalent circuit with lumped elements. Thanks to this equivalent circuit and to previous work, it will be possible to determine with good accuracy the current distribution in metallized capacitors. ©1997 American Institute of Physics.