Discrete software reliability growth models
作者:
Shioeru Yamada,
Shunji Osaki,
期刊:
Applied Stochastic Models and Data Analysis
(WILEY Available online 1985)
卷期:
Volume 1,
issue 1
页码: 65-77
ISSN:8755-0024
年代: 1985
DOI:10.1002/asm.3150010108
出版商: John Wiley&Sons, Ltd.
关键词: Software reliability;Non‐homogeneous;Poisson process;Maximum likelihood;Applied stochastic processes
数据来源: WILEY
摘要:
AbstractA general description of a discrete software reliability growth model, which adopts the number of test runs or the number of executed test cases as the unit of error detection period, is presented. Two classes of discrete software reliability growth models are proposed and discussed. These models can be described by non‐homogeneous Poisson processes, in which the random variable is denned as the number of errors detected byntest runs (n= 0, 1, 2,…). The application and comparison of these models to actual software error data are sh
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