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Discrete software reliability growth models

 

作者: Shioeru Yamada,   Shunji Osaki,  

 

期刊: Applied Stochastic Models and Data Analysis  (WILEY Available online 1985)
卷期: Volume 1, issue 1  

页码: 65-77

 

ISSN:8755-0024

 

年代: 1985

 

DOI:10.1002/asm.3150010108

 

出版商: John Wiley&Sons, Ltd.

 

关键词: Software reliability;Non‐homogeneous;Poisson process;Maximum likelihood;Applied stochastic processes

 

数据来源: WILEY

 

摘要:

AbstractA general description of a discrete software reliability growth model, which adopts the number of test runs or the number of executed test cases as the unit of error detection period, is presented. Two classes of discrete software reliability growth models are proposed and discussed. These models can be described by non‐homogeneous Poisson processes, in which the random variable is denned as the number of errors detected byntest runs (n= 0, 1, 2,…). The application and comparison of these models to actual software error data are sh

 

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