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Growth by molecular beam epitaxy and characterization of high purity GaAs and AlGaAs

 

作者: M. Heiblum,   E. E. Mendez,   L. Osterling,  

 

期刊: Journal of Applied Physics  (AIP Available online 1983)
卷期: Volume 54, issue 12  

页码: 6982-6988

 

ISSN:0021-8979

 

年代: 1983

 

DOI:10.1063/1.332015

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We report on the growth by molecular beam epitaxy of high‐quality GaAs and AlxGa1−xAs (x≲0.43), and discuss the effect of system parameters on material quality. The highest Hall mobility in GaAs at 77 °K was 144 000 cm2/V sec, and the photoluminescence spectra of undoped layers exhibited a strong free exciton line and a much reduced carbon peak with no carbon‐related defects. A slow growth process at a substrate temperature of 600 °C produced excellent AlxGa1−xAs whose luminescence spectrum showed a distinct excition peak 4 meV wide. This AlxGa1−xAs is compared to layers grown at a faster rate at substrate temperatures of 700 °C.

 

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