Allin situdeposition and characterization of YBa2Cu3O7−xthin films by low‐energy ion scattering spectroscopy
作者:
T. Nakamura,
S. Tanaka,
M. Iiyama,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 66,
issue 24
页码: 3362-3364
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.113758
出版商: AIP
数据来源: AIP
摘要:
C‐axis oriented YBa2Cu3O7−x(YBCO) thin films were deposited by an ozone‐assisted reactive coevaporation method and characterized byinsitulow‐energy ion scattering spectroscopy (LEISS). We successfully evaluated compositional information in depth by an angle‐resolved LEISS method and a depth profiling LEISS method. These LEISS analyses indicated that the second outermost layer of the YBCO surface consisted of Ba atoms. This result confirmed that YBCO surfaces were terminated by Cu(1)‐O chains. ©1995 American Institute of Physics.
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