首页   按字顺浏览 期刊浏览 卷期浏览 Allin situdeposition and characterization of YBa2Cu3O7−xthin films by low‐...
Allin situdeposition and characterization of YBa2Cu3O7−xthin films by low‐energy ion scattering spectroscopy

 

作者: T. Nakamura,   S. Tanaka,   M. Iiyama,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 66, issue 24  

页码: 3362-3364

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.113758

 

出版商: AIP

 

数据来源: AIP

 

摘要:

C‐axis oriented YBa2Cu3O7−x(YBCO) thin films were deposited by an ozone‐assisted reactive coevaporation method and characterized byinsitulow‐energy ion scattering spectroscopy (LEISS). We successfully evaluated compositional information in depth by an angle‐resolved LEISS method and a depth profiling LEISS method. These LEISS analyses indicated that the second outermost layer of the YBCO surface consisted of Ba atoms. This result confirmed that YBCO surfaces were terminated by Cu(1)‐O chains. ©1995 American Institute of Physics.

 

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