Imaging and Diffraction Study of Continuous α‐Fe2O3Films on (0001)Al2O3
作者:
Lisa A. Tietz,
C. Barry Carter,
期刊:
Journal of the American Ceramic Society
(WILEY Available online 1992)
卷期:
Volume 75,
issue 5
页码: 1097-1102
ISSN:0002-7820
年代: 1992
DOI:10.1111/j.1151-2916.1992.tb05544.x
出版商: Blackwell Publishing Ltd
关键词: iron oxide;films;alumina;interfaces;transmission;electron microscopy
数据来源: WILEY
摘要:
Continuous α‐Fe2O3films grown on bulk (0001)Al2O2substrates by low‐pressure chemical vapor deposition have been studied by transmission electron microscopy and the observations compared to those obtained from discontinuous films at an earlier stage of the growth process. Plan‐view specimens revealed significant thermal stress in the continuous films, while cross‐sectional specimens showed that cracking occurs in thicker films. The free surface of the film and the film/substrate interface appeared sharp and flat, apart from growth ledges and steps. Weak‐beam imaging revealed a hexagonal misfit dislocation network consisting of perfect edge dislocations. Fine structure in the selected‐area diffraction patterns which corroborates these observations is also discussed. The misfit network of partial dislocations previously observed in the discontinuous films was not observed for the continuous films, indicating an effect of film thickness, growth rate, or surface preparation on the Fe2O3/(0001)Al2O3interfa
点击下载:
PDF
(718KB)
返 回