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Thin‐film x‐ray analysis using the Read camera: A refinement of the technique

 

作者: K. Tao,   C. A. Hewett,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1987)
卷期: Volume 58, issue 2  

页码: 212-214

 

ISSN:0034-6748

 

年代: 1987

 

DOI:10.1063/1.1139309

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The accuracy of lattice parameter determinations by Read camera x‐ray diffraction is shown to be strongly dependent on camera alignment. Alignment of the Read camera eliminates the main sources of error. Further improvement in analysis was achieved by constructing a collimator with a rectangular cross section. Analysis and testing showed that the rectangular collimator enhances the efficiency, resolution, precision, and peak‐to‐background intensity ratio for x‐ray analysis of thin films using the Read camera.

 

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