Thin‐film x‐ray analysis using the Read camera: A refinement of the technique
作者:
K. Tao,
C. A. Hewett,
期刊:
Review of Scientific Instruments
(AIP Available online 1987)
卷期:
Volume 58,
issue 2
页码: 212-214
ISSN:0034-6748
年代: 1987
DOI:10.1063/1.1139309
出版商: AIP
数据来源: AIP
摘要:
The accuracy of lattice parameter determinations by Read camera x‐ray diffraction is shown to be strongly dependent on camera alignment. Alignment of the Read camera eliminates the main sources of error. Further improvement in analysis was achieved by constructing a collimator with a rectangular cross section. Analysis and testing showed that the rectangular collimator enhances the efficiency, resolution, precision, and peak‐to‐background intensity ratio for x‐ray analysis of thin films using the Read camera.
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