Threshold characteristics of epitaxial Al(Ga,As) surface‐emitting lasers with integrated quarter‐wave high reflectors
作者:
P. L. Gourley,
T. J. Drummond,
T. E. Zipperian,
J. L. Reno,
T. A. Plut,
期刊:
Journal of Applied Physics
(AIP Available online 1988)
卷期:
Volume 64,
issue 11
页码: 6578-6580
ISSN:0021-8979
年代: 1988
DOI:10.1063/1.342033
出版商: AIP
数据来源: AIP
摘要:
We report a study of threshold characteristics of as‐grown surface‐emitting lasers fabricated with molecular‐beam epitaxy by the monolithic integration of two quarter‐wave high reflectors (mirrors) of AlAs/Al0.4Ga0.6As surrounding an active spacer layer. The spacer was either a multiple quantum well of GaAs/Al0.4Ga0.6As (100 A˚/200 A˚) or GaAs. Several structures were grown corresponding to different mirror reflectance and different spacer thicknesses from ultrashort 0.9 to 10 &mgr;m. One of the structures was chemically etched to form a two‐dimensional array of microlasers. All of the structures were photopumped at room temperature, and the lasing threshold was determined. Without any lateral confinement, the threshold irradiance was as low as 2×105W/cm2. Near‐field images of the light emitted slightly above threshold reveal several competing filaments. This competition broadens the lasing linewidth, but can be controlled by lateral confinement schemes.
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