A two‐dimensional micropositioning device for scanning tunneling microscope (STM) probes has been developed. This device uses the principle of piezoelectric inertial translation to produce a controlled stepping motion of the probe along vertical and horizontal axes over distances of several mm. The tip micropositioner is controlled by the same electrical signals that drive the scanning piezoelectric element, thus alleviating the need for additional electronic control elements. This device has been tested on STMs operating in air and in ultrahigh vacuum environments.