Monte Carlo simulations of secondary electron emission from CsI, induced by 1–10 keV x rays and electrons
作者:
A. Akkerman,
A. Gibrekhterman,
A. Breskin,
R. Chechik,
期刊:
Journal of Applied Physics
(AIP Available online 1992)
卷期:
Volume 72,
issue 11
页码: 5429-5436
ISSN:0021-8979
年代: 1992
DOI:10.1063/1.351984
出版商: AIP
数据来源: AIP
摘要:
A model for electron transport and emission in CsI is proposed. It is based on theoretically calculated microscopic cross sections for electron interaction with the nuclear and the electronic components of the solid. A Monte Carlo program based on this model was developed to simulate secondary electron emission induced by x rays and electrons in the energy range of 1 to 10 keV. The calculated secondary emission yields agree with existing experimental data. The model provides all necessary characteristics for the design of radiation detectors based on secondary electron emission. It can be expanded to higher incident energies and other alkali halides.
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