首页   按字顺浏览 期刊浏览 卷期浏览 Monte Carlo simulations of secondary electron emission from CsI, induced by 1–10 ...
Monte Carlo simulations of secondary electron emission from CsI, induced by 1–10 keV x rays and electrons

 

作者: A. Akkerman,   A. Gibrekhterman,   A. Breskin,   R. Chechik,  

 

期刊: Journal of Applied Physics  (AIP Available online 1992)
卷期: Volume 72, issue 11  

页码: 5429-5436

 

ISSN:0021-8979

 

年代: 1992

 

DOI:10.1063/1.351984

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A model for electron transport and emission in CsI is proposed. It is based on theoretically calculated microscopic cross sections for electron interaction with the nuclear and the electronic components of the solid. A Monte Carlo program based on this model was developed to simulate secondary electron emission induced by x rays and electrons in the energy range of 1 to 10 keV. The calculated secondary emission yields agree with existing experimental data. The model provides all necessary characteristics for the design of radiation detectors based on secondary electron emission. It can be expanded to higher incident energies and other alkali halides.

 

点击下载:  PDF (945KB)



返 回