Soft x-ray and Auger electron spectroscopy of single and double electron capture processes in slow Ne8++He collisions
作者:
S. Bliman,
M. Cornille,
A. Langereis,
J. Nordgren,
R. Bruch,
R. Phaneuf,
J. Swenson,
D. Schneider,
期刊:
Review of Scientific Instruments
(AIP Available online 1997)
卷期:
Volume 68,
issue 1
页码: 1080-1082
ISSN:0034-6748
年代: 1997
DOI:10.1063/1.1147792
出版商: AIP
数据来源: AIP
摘要:
We have performed high resolution extreme ultraviolet (EUV) photon and Auger electron measurements to elucidate single and double capture processes in Ne8++He single collisions at 80 keV impact energy. Numerous new transitions both in the Auger and the EUV spectra have been identified by means of extensive theoretical calculations and correlation diagrams. These data are of importance for the modeling of impurities in plasma and for future plasma diagnostics. ©1997 American Institute of Physics.
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