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Soft x-ray and Auger electron spectroscopy of single and double electron capture processes in slow Ne8++He collisions

 

作者: S. Bliman,   M. Cornille,   A. Langereis,   J. Nordgren,   R. Bruch,   R. Phaneuf,   J. Swenson,   D. Schneider,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1997)
卷期: Volume 68, issue 1  

页码: 1080-1082

 

ISSN:0034-6748

 

年代: 1997

 

DOI:10.1063/1.1147792

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have performed high resolution extreme ultraviolet (EUV) photon and Auger electron measurements to elucidate single and double capture processes in Ne8++He single collisions at 80 keV impact energy. Numerous new transitions both in the Auger and the EUV spectra have been identified by means of extensive theoretical calculations and correlation diagrams. These data are of importance for the modeling of impurities in plasma and for future plasma diagnostics. ©1997 American Institute of Physics.

 

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