A design is presented for a cryogenic scanning tunneling microscope which has demonstrated atomic resolution at temperatures between 300 and 120 K in ultrahigh vacuum. The design features simpleinsituexchange of samples and tips, active cooling of the sample, excellent visibility of the sample‐tip region, and the use of a thermally isolated inchworm translator for coarse approach. It has demonstrated atomic resolution on SI(111)‐(7×7) and Si(001) surfaces at 120 K.