The X‐Ray Shadow Microscope
作者:
V. E. Cosslett,
W. C. Nixon,
期刊:
Journal of Applied Physics
(AIP Available online 1953)
卷期:
Volume 24,
issue 5
页码: 616-623
ISSN:0021-8979
年代: 1953
DOI:10.1063/1.1721338
出版商: AIP
数据来源: AIP
摘要:
Shadow projection permits higher resolution and simpler operation than other methods of x‐ray microscopy. A point source, less than 1&mgr; in diameter, is obtained by the use of magnetic electron lenses and used for projecting shadow images at a primary magnification up to 100× with an exposure time in the order of minutes. The use of a metal foil as target and tube window insures high intensity at the specimen, which is in air. A resolving power little short of the best optical performance has been obtained with an accelerating voltage of 10 kv. The practical limitations to resolution, contrast, and exposure time are discussed in detail. A resolution of 100A should be practicable, but only with longer x‐rays and an exposure of the order of 1 hour.
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