A noncontact cryogenic microwave measurement system for superconducting device characterization
作者:
Alp T. Findikoglu,
T. Nakamura,
H. Tokuda,
M. Iiyama,
期刊:
Review of Scientific Instruments
(AIP Available online 1994)
卷期:
Volume 65,
issue 9
页码: 2912-2915
ISSN:0034-6748
年代: 1994
DOI:10.1063/1.1144638
出版商: AIP
数据来源: AIP
摘要:
A noncontact cryogenic microwave measurement system has been developed for the characterization of passive and active superconducting devices by means of an unloaded quality factor measurement technique. The measurement system was designed specifically for the characterization of planar thin film resonant structures as a function of temperature (4–300 K), frequency (100 MHz–26.5 GHz), and dc voltage bias (≤100 V). It has been used for basic device studies of novel active superconducting lumped components made of metal‐oxide superconductor/insulator heterostructures.
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