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Electrostatic lens for microscopy

 

作者: S. Yamaguchi,  

 

期刊: Journal of Applied Physics  (AIP Available online 1978)
卷期: Volume 49, issue 12  

页码: 6160-6161

 

ISSN:0021-8979

 

年代: 1978

 

DOI:10.1063/1.324539

 

出版商: AIP

 

数据来源: AIP

 

摘要:

An electrostatic lens for electron microscopy was devised in which a dielectric was charged with electrons in order to give rise to an electrostatic field. The lens performed well when an electron beam was steadily running through it. It was possible to obtain a diffraction pattern from an object suitable for observation by electron microscopy.

 

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