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Microstructure of hot-pressed α-Sic after creep experiments at high temperature

 

作者: S.J. Lee,   G. Nouet,   J. Vicens,  

 

期刊: Philosophical Magazine Letters  （Taylor Available online 1989）
卷期: Volume 60, issue 2  

页码: 37-44

 

ISSN:0950-0839

 

年代: 1989

 

DOI:10.1080/09500838908206433

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

Transmission electron microscopy analyses of hot-pressed α-Sic deformed at 1600°C have shown the activation of the basal plane with glide dislocations dissociated into Shockley partials. Loop nucleations have been frequently observed along the dislocation lines and a climb mechanism is proposed to explain, the experimental analyses.

 

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