New approach of measuring theQfactor of a microwave cavity using the cavity perturbation technique
作者:
V. Subramanian,
J. Sobhanadri,
期刊:
Review of Scientific Instruments
(AIP Available online 1994)
卷期:
Volume 65,
issue 2
页码: 453-455
ISSN:0034-6748
年代: 1994
DOI:10.1063/1.1145156
出版商: AIP
数据来源: AIP
摘要:
A new approach of measuring the quality factor of the reflection type microwave cavity resonator for calculating the complex dielectric permittivity of solid and liquid samples in the cavity perturbation technique is proposed. This approach, based on the measurement of reflected power from the cavity at resonance, effectively reduces the measurement procedure and increases the accuracy. As the quality factor can be measured very fast using this approach, this approach can be extended to monitor the conductivity decay of the semiconductor samples.
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