Photothermal detection for light‐scattering material by laser interferometry
作者:
L. Chen,
S. Y. Zhang,
期刊:
Applied Physics Letters
(AIP Available online 1987)
卷期:
Volume 50,
issue 19
页码: 1340-1342
ISSN:0003-6951
年代: 1987
DOI:10.1063/1.97900
出版商: AIP
数据来源: AIP
摘要:
A highly sensitive photothermal scheme is described, in which the photothermally induced refractive index variation is measured by a specially designed interferometry. The setup is very simple and stable in facilitating practical applications. It can be used for light‐scattering samples, as well as other state samples. Some experiments for detection of both periodic and nonperiodic photothermal refractive index variation are performed.
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