Direct visualization of electromagnetic microfields by interference of three electron waves
作者:
Tsukasa Hirayama,
Takayoshi Tanji,
Akira Tonomura,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 67,
issue 9
页码: 1185-1187
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.115001
出版商: AIP
数据来源: AIP
摘要:
A method is presented for direct visualization of electromagnetic microfields. Using a transmission electron microscope equipped with a field‐emission electron gun and two electron biprisms, an object wave and two reference waves are superposed to interfere for producing a new type of interference pattern in which electromagnetic fields are directly observed. Equal‐potential lines of an electric field around a latex particle and magnetic flux lines emerging from a barium ferrite particle have been observed. ©1995 American Institute of Physics.
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