Electrical and optical characterization of grain boundaries in polycrystalline cadmium telluride
作者:
Thomas P. Thorpe,
Alan L. Fahrenbruch,
Richard H. Bube,
期刊:
Journal of Applied Physics
(AIP Available online 1986)
卷期:
Volume 60,
issue 10
页码: 3622-3630
ISSN:0021-8979
年代: 1986
DOI:10.1063/1.337569
出版商: AIP
数据来源: AIP
摘要:
The optical and electrical properties of grain boundaries inn‐ andp‐type CdTe have been investigated by analysis of single boundaries within bicrystals and of polycrystalline thin films. The grain‐boundary parameters evaluated include the conductivity activation energy, the boundary diffusion potential, the energy distribution of grain‐boundary states, the minority‐carrier recombination velocity, the majority–carrier capture coefficient, and the optical cross section of grain‐boundary states. Passivation experiments indicate that heat treatment in H2or Li provide effective but temporary passivation inp‐type CdTe, and that similar effects are found for heat treatment in air forn‐type material.
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