X‐ray double and triple crystal diffractometry of mosaic structure in heteroepitaxial layers
作者:
V. Holy´,
J. Kubeˇna,
E. Abramof,
K. Lischka,
A. Pesek,
E. Koppensteiner,
期刊:
Journal of Applied Physics
(AIP Available online 1993)
卷期:
Volume 74,
issue 3
页码: 1736-1743
ISSN:0021-8979
年代: 1993
DOI:10.1063/1.354828
出版商: AIP
数据来源: AIP
摘要:
X‐ray diffraction in thin layers containing small randomly placed defects is described by means of the kinematical diffraction theory and optical coherence formalism. The method enables us to calculate both the diffracted intensity and its angular distribution, so that it can be used for simulating double crystal and triple crystal x‐ray diffractometry experiments. The theory has been applied to experimental data obtained from diffractometry measurements of an epitaxial ZnTe layer with mosaic structure after several steps of chemical thinning. A good agreement of the theory with experiments has been achieved.
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