This paper presents maximum likelihood theory for large-sample optimum accelerated life test plans. The plans are used to estimate a simple linear relationship between (transformed) stress and product life, which has a Weibull or smallest extreme value distribution. Censored data are to be analyzed before all test units fail. The plans show that all test units need not run to failure and that more units should be tested at low test stresses than at high ones. The plans are illustrated with a voltage-accelerated life test of an electrical insulating fluid.